Silicon Resistivity&PN type&AlarmTester |
Infrared Inspection System |
Minority carrier lifetime System |
Oxygen and carbon Tester |
Typel Tester |
Non-contact Resistivity Tester |
Silicon Filament Resistivity Tester |
Wafer defect observation instrument |
Heavily doped tweezerse |
Silicon dopant |
Seed crystal |
Gallium dopant | IPCE&QE |
PL System |
Process Software
姹犲強(qiáng)紜呮潗鏂欐嫻媆灝戝瓙瀵垮懡鍙?qiáng)绾㈠\MWR-2S-3I鏃犳帴瑙﹀皯瀛愬鍛藉強(qiáng)綰㈠鎺激緇煎悎嫻嬭瘯浠猏MWR-2S-3I-3-small.gif "Contactless Lifetime Measurement and Inh")
闃荤巼\NCS-R90鏃犳帴瑙︽柟闃繪祴璇曠郴緇焅NCS-R90-small.gif "Non-contact Resistivity Tester")
姹犲強(qiáng)紜呮潗鏂欐嫻媆鐢墊睜I(yíng)-V鐗規(guī)€у垎鏋怽PET CC緋誨垪IV鐗規(guī)€у垎鏋愮郴緇焅PET-CC-2-small.gif "IV Tester System")
姹犲強(qiáng)紜呮潗鏂欐嫻媆姘寲紜匼SiN-1-small.gif "Higher purity Silicon Nitride")
姹犲強(qiáng)紜呮潗鏂欐嫻媆鑷姩嫻嬭瘯鏋禱hs-ats-100-small.GIF "Automatic Testing Stand")
姹犲強(qiáng)紜呮潗鏂欐嫻媆澶槼鑳界數(shù)姹犳爣鏍穃standardsolarcell-small.gif "Standard Solar Cell")
Silicon Resistivity&PN type&AlarmTester |
Infrared Inspection System |
Minority carrier lifetime System |
Oxygen and carbon Tester |
Typel Tester |
Non-contact Resistivity Tester |
Silicon Filament Resistivity Tester |
Wafer defect observation instrument |
Heavily doped tweezerse |
Silicon dopant |
Seed crystal |
Gallium dopant | IPCE&QE |
PL System |
Process Software
