青青草欧美亚洲日本,日韩人妻中文字幕有码,日韩外围三级在线观看,国产av国,亚洲天堂网中字成人区,久操国产在线资源,欧洲亚洲天堂精品好看,伊人a视频,欧美有码一区二区

                



       The multiple angle laser ellipsometer provides film thickness, refractive index and absorption index at the HeNe laser wavelength 632,8 nm with an extraordinary precision and accuracy. It can be utilized to characterize single films, multiple layer stacks and bulk materials. 

 
Applications:

■ Microelectronics

■ Photovoltaic

 
Product's Feature:

■ High stability and accuracy

■ Laser wavelength 632.8 nm

■ Goniometer with angles of incidence set in 5o steps 

■ Multiple angle measurements 

■ Large material database 

■ Fully integrated support of multiple angle measurements for more complex applications and absolute thickness 

■ Fast and comfortable measurement at a selectable, application specific single angle of incidence

 
Technique Specification:
■ Precision of ψ, Δ at 90° (transmission) position: δ(ψ)=0.002°, δ(Δ)=0.002° 

■ Long term stability: δ(ψ)=±0.1°, δ(Δ)=±0.1° 

■ Precision of film thickness: 0.01nm  for 100 nm SiO2 on Si 

■ Precision of refractive index: 0.0005  for 100 nm SiO2 on Si

 
Typical Customer: 

American,Europe and Asia and so on.